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3-D measurement based on phase-shifting using calibration of light plane

  • Yingqing Chen
  • , Sining Li
  • , Wei Lu
  • , Zijian Li
  • , Gang Liu
  • School of Astronautics, Harbin Institute of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Based on the phase-shifting fringe scanning projection technique using MEMS galvanometer, the threedimensional shape measurement of the object can be realized. However, we found that the experimental results were more sensitive to some experimental parameters. To avoid it, we introduced a light plane calibration model in the threedimensional measurement system. This calibration model avoids the physical measurement of some experimental parameters, and at the same time makes the operation more convenient and faster, and improves the stability and operability of the experiment. Through the detection experiment of the plane, the relative root mean square relative error of the obtained result is 9.155mm, which is greatly improved compared with the previous experimental results, but the result is still not ideal. We discuss some factors affecting the accuracy of the system which can be improved in the future. The experiment proved its feasibility and potential, and the Powell prism and MEMS galvanometer selected are small in size. The dimensions of Powell prism and MEMS galvanometer are 9.0mm 8.0mm and 2.5mm 3.0mm respectively. The miniaturization of equipment is very advantageous for achieving integration and maintenance of the device.

Original languageEnglish
Title of host publication14th National Conference on Laser Technology and Optoelectronics, LTO 2019
EditorsJianqiang Zhu, Weibiao Chen, Zhenxi Zhang, Minlin Zhong, Pu Wang, Jianrong Qiu
PublisherSPIE
ISBN (Electronic)9781510630468
DOIs
StatePublished - 2019
Externally publishedYes
Event14th National Conference on Laser Technology and Optoelectronics, LTO 2019 - Shanghai, China
Duration: 17 Mar 201920 Mar 2019

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume11170
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference14th National Conference on Laser Technology and Optoelectronics, LTO 2019
Country/TerritoryChina
CityShanghai
Period17/03/1920/03/19

Keywords

  • 3-D measurement
  • Light plane calibration
  • Phase shifting
  • Single MEMS mirror

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